reliability burn-in testing
相关结果约56348条Smiths Interconnect Socket Improving Time-and Cost-efficiency In Reliability Burn-in Testing
When companies develop new devices, they must ensure there are no failures in the field. This means that thorough reliability burn-in testing must take place from the start to avoid malfunctions down the road.
What is Thermal Simulation and Why is it Important to Reliability Burn-in Testing?
Not every semiconductor manufacturer utilizes thermal simulation in their reliability testing setup. Lower power burn-in allows for an acceptable temperature rise within the package/die in a traditional burn-in chamber running at 125℃. As packages in burn-in are moving to higher power output, socket, and burn-in systems may need to have enhanced features to manage the desired target die temps.
广告 发布时间 : 2025-01-06
Exxelia Ohmcraft Precision Resistors Help Ensure Reliability of The Powerful Minuteman
To keep the ICBM modernized and ensure its product performance throughout the years, military contractors turned to Exxelia Ohmcraft to develop the custom resistors required to support the missile’s rigorous precision and reliability specifications. Exxelia Ohmcraft performs a full range of military lot acceptance testing (LAT) on its resistors to meet the unique design requirements for each particular application. In the case of the Minuteman III, the resistors’ small form factor was crucial to keeping the missile as lightweight as possible.
Reliability Testing of COTS Fibre Optic Transceivers
With a dedicated design associated with critical circuit adjustments, COTS optical fiber transceivers can meet space applications requirements and are thus ready for short term deployment in large bandwidth communication satellites.
Hongfa High Frequency Relays HFD32, HFD43 and HFD45 with Excellent High-Frequency Performance, High Reliability and Small Size
Hongfa has launched high-frequency relays with excellent high-frequency performance, high reliability and small size, which are widely used in network communication, automation control and testing, medical, radio and television and other fields.
三端双向可控硅TMG1C60 5、TMG1C80 5(H-T010B)的可靠性测试
SANREX - 双向可控硅,TRIAC,TMG1C,TMG1C SERIES,TMG1C80 5,TMG1C60 5
58604型半导体激光器老化可靠性测试系统
Chroma 58604是一款高密度、多功能且温度控制的激光二极管烧录与寿命测试系统。该系统具有高达256个SMU通道,提供各种控制模式下的源电流和测量电压。系统能够在自动电流控制和自动功率控制模式下运行,并具备精确的温度控制系统。
CHROMA - LASER DIODE BURN-IN,温控试验系统,TEMPERATURE CONTROLLED TEST SYSTEM,MODEL 58604,寿命试验,激光二极管老化,LIFETIME TEST
What testing services does Laird Thermal Systems provide?
Laird Thermal Systems offers validation test services to support compliance standards for each industry, including UL/CSA and MIL‐STDs. Our in-house test capabilities support: Noise measurement, Cooling capacity, Pressure and flow rates, Electronic drive circuit testing, Reliability testing, G‐force testing, High temp oven storage testing, Temperature cycling, Continuous operation testing.
EPC氮化镓FET应用准备:第五阶段测试可靠性报告
本报告详细介绍了Efficient Power Conversion Corporation(EPC)第二代200V eGaN® FETs的可靠性测试结果。报告涵盖了高温反向偏置(HTRB)、高温栅极偏置(HTGB)、高温高湿反向偏置(H3TRB)、温度循环(TC)等测试项目,结果显示所有测试参数均保持稳定。此外,报告还讨论了统计失效率、平均时间到故障(MTTF)等可靠性指标,并指出eGaN® FETs在多种应力条件下的可靠性表现优异。
EPC - 氮化镓®场效应晶体管,GAN® FETS,EPC1001,EPC1012,FP4549SI,EPC1014,EPC1015,EPC2015,M705-GRN360,EPC2010,EPC9001,EPC9002,EPC2012,EPC1010,EPC2001,NC257-2,SAC305,SMC375X7,T300,M705-GRN360-
Inductor AEC-Q200 Compliance
AEC-Q200 is a test standard for certifying the reliability of passive components. It specifies the testing requirements and test quantities for each component.
Tgrease 2500可靠性试验报告
本报告对Tgrease 2500的热阻性能进行了可靠性测试,包括125°C热烘焙、-55°C至125°C热循环和85°C/85%RH高湿度热烘焙(HAST)。测试结果显示,Tgrease 2500在这些条件下热阻性能保持稳定,未出现明显变化。
LAIRD - TGREASE 2500
Further Increase MLCC Reliability with CSAM Testing
At Knowles Precision Devices ,they use a non-destructive analysis technique to check for failure modes known as confocal scanning acoustic microscopy (CSAM).
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