【产品】具有八个平行测试站点的逻辑测试分类机3180,温度测试范围从常温到高温150 ℃
CHROMA的3180逻辑测试分类机是一款运用Pick & Place技术的量产型机台,适合高产出多测试站点的IC测试。节省了厂房空间、测试时间和成本,3180创新的设计可提高生产力和生产效率。机台可配置作单站,双站,四站或八站测试,亦可升级作高温150℃测试.。
逻辑测试分类机
3180有着高可靠性的处理机制,可依据测试需求支持各种不同类型封装的晶片,且能与通用生产治具相容,顺畅的自动化技术满足高产能和低Jam Rate的量产要求。此外,可调式的压测力和位置校正以及各种感应装置可降低待测物发生突如其来的损坏,和帮助延长socket的使用期,同时保持或提升产能的良率。
3180逻辑测试分类机的主要特色:
· 具有八个平行测试站点
· 9Kpcs 产能
· 弹性的多测点架构
· 减轻压测力
· 自动压测力学习
· 支持的晶片尺寸从 3×3 mm 到50×50 mm
· 温度测试范围从常温到高温150 ℃
· 连续自动重测功能
· 测试良率控制功能
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本文由宝丁转载自Chroma,原文标题为:逻辑测试分类机 Model 3180,本站所有转载文章系出于传递更多信息之目的,且明确注明来源,不希望被转载的媒体或个人可与我们联系,我们将立即进行删除处理。
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晶圆/晶片/封装 半导体IC测试解决方案
型号- 3180,A330101,3680,33010,3380D,3160F,36020,3160A,3240,3160C,3260,3380,3160,3110-FT,3380P,3650-CX,3650-EX,3650,7710,3112,3111,3110,36010,A360101,3270,3240Q,54100,3240-Q
半导体测试解决方案 晶圆/晶片/封装
型号- MODEL 3110,MODEL 3110-FT,MODEL 3180-IS,MODEL 7710,MODEL 3650,MODEL 3160C,MODEL 3111,3180,3680,MODEL 3160A,3200,3650 系列,3160A,MODEL 33010,3160C,3260,MODEL 33011,3160,3110-FT,3680 系列,MODEL 33020,MODEL 3200,MODEL 3260,MODEL 3680,3650,7710,3180-IS,3111,3110,MODEL 3380-P,MODEL 33021,3270,3240Q,MODEL 3380-D,MODEL 3180,MODEL 3380
半导体测试解决方案 晶圆/芯片/封装
型号- MODEL 3110,MODEL 3110-FT,MODEL 7710,54100 SERIES,3180,MODEL 3111,A330101,3680,3200,33010,3380D,MODEL 33010,3260,3380,MODEL 33011,33011,3110-FT,MODEL 3180-CS,3160-C,3160-A,3380P,MODEL 3650-S2,MODEL 33020,3180-CS,MODEL 3160-A,MODEL 3200,MODEL 3160-C,MODEL 3260,MODEL 3680,7710,33020,33021,3111,3210,3650-S2,3110,3380-P,MODEL 3380-P,MODEL 33021,3270,54100,MODEL 3380-D,MODEL 3180,MODEL 3380,3380-D,3240-Q
Semiconductor Test Solutions
型号- MODEL 3110,MODEL 3110-FT,MODEL 7710,3180,MODEL 3111,A330101,3680,3200,33010,3380D,MODEL 33010,3260,3380,MODEL 33011,33011,3110-FT,MODEL 3180-CS,3160-C,3160-A,3380P,MODEL 3650-S2,MODEL 33020,3180-CS,MODEL 3160-A,MODEL 3200,MODEL 3160-C,MODEL 3260,MODEL 3680,7710,33020,33021,3111,3650-S2,3110,3380-P,MODEL 3380-P,MODEL 33021,MODEL 3380-D,MODEL 3180,MODEL 3380,3380-D
Semiconductor Test Solutions Wafer/Chip/Package
型号- MODEL 3110,MODEL 3110-FT,MODEL 3180-IS,MODEL 7710,MODEL 3650,MODEL 3160C,3180,MODEL 3111,3680,MODEL 3160A,3200,33010,3380D,3160A,MODEL 33010,3160C,3260,3380,MODEL 33011,3160,3680 SERIES,33011,3110-FT,3380P,MODEL 33020,MODEL 3200,MODEL 3260,MODEL 3680,3650,3650 SERIES,7710,3180-IS,33020,33021,3111,3110,3380-P,MODEL 3380-P,MODEL 33021,3270,3240Q,MODEL 3380-D,MODEL 3180,MODEL 3380,3380-D
Semiconductor/IC Test Solutions Wafer/Chip/Package
型号- 3180,A330101,3680,33010,LPC 128,3160F,36020,3160A,3240,3160C,3260,DPS 32,3380,3160,3110-FT,3650-CX,3650-EX,3650,7710,3112,3111,3110,3380-P,36010,A360101,3270,3240Q,54100,3380-D,3240-Q
【选型】Chroma(致茂)电力电子测试设备产品选型指南
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