Reducing Retest Improves First Pass Yield (FPY) with PathWave Manufacturing Analytics

时间： 2022-04-28 来源：Keysight

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A contract manufacturing was able to reduce retest rates and significantly increase First Pass Yield ~50% by using the tools built into PathWave Manufacturing Analytics.

PathWave Manufacturing Analytics (PMA) provides a big data platform for performing time-series analytics on all kinds of test equipment in a manufacturing environment. In this customer success story, the contract manufacturer is utilizing KEYSIGHT's Cloud platform for hosting the analytics to speed deployment and reduce the upfront server infrastructure investment costs and maintenance. This allowed them to quickly deploy PMA for their manufacturing line and dig into the data in a matter of days.

Figure 1 is the volume by project with the project highlighted that was selected for investigation. It had a high retest rate, by volume, and a low First Pass Yield.

Figure 1: Volume by project showing the unique serial number counts for passing, retest, and failed boards.

By simply selecting the project and then the Failure Count By Test Type by Fixture ID, the engineer was able to gain insights into the most frequently failing, and later passing, tests. The action was to take a look at the physical test equipment to inspect it. Since PMA can identify the tests and by extension the probes, with an optional probe heatmap, the engineer was able to find all the worn out probes that required replacement.

Figure 2: Pareto of the highest failing test names to drill into.

In conclusion, using one of the tools in PMA to drill into retest and failing tests the engineer was able to take corrective action and identify the root cause of the test equipment issues.

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