Chroma ATE Showcases Advanced Test Technology to Propel the AI Revolution at SEMICON Taiwan 2023

时间： 2023-08-31 来源：CHROMA官网

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Chroma ATE Inc., a leading provider of automated test equipment, is participating in SEMICON Taiwan 2023. The company will exhibit a series of innovative test solutions with a focus on artificial intelligence (AI), high-performance computing (HPC), automotive, and AIoT applications, aiming to meet the ever-evolving needs of semiconductor testing.

Advanced SoC/Analog Test Solutions

The Chroma 3650-S2 SoC/Analog Test System is a high-performance Power IC test platform that meets the needs of today's high-voltage, high-current, and complex digital control Power ICs. It comes equipped with up to 768 digital I/O and analog pins with a power supply capacity of up to 3000V or 320A, featuring a 200Mbps data rate and 300ps edge placement accuracy (EPA). It's an ideal choice for testing lithium battery management system (BMS) ICs, power management ICs (PMIC), and GaN- and SiC-related power ICs.

The Chroma 3680 Advanced SoC Test System effectively meets the testing needs of bleeding-edge chips used in AI and automotive technologies. The system provides up to 2048 I/O pins with data rates up to 1Gbps, supports up to 16G SCAN vector memory, and offers a variety of test modules for users to choose from. It has the capability to simultaneously perform digital logic, parametric test unit, power, memory, mixed-signal, and RF wireless communication tests.

RF Chip Test Solutions

The Chroma 3680/3380/3300 Automated Test Systems, integrated with the RFIC Tester Model 35806, offer a comprehensive radio frequency (RF) chip test solution that has already been validated for mass production by our customers. This enhanced solution supports a range of applications including Bluetooth, Wi-Fi, NB-IoT, as well as GPS/BeiDou and Tuner & PA IoT communication standards. Notably, it features an ultra-high frequency bandwidth VSG/VSA module with coverage ranging from 300K all the way up to 6GHz, making it suitable for a broad spectrum of emerging wireless communication standards.

SLT Tri-Temp Test Solution

Chroma 31000R-L is a Tri-Temp test system designed to meet the most demanding thermal test requirements. With stable temperature control capabilities ranging from -40℃ to +150℃ and DUT (Device Under Test) cooling capacity of up to 1,800W, this system is an ideal choice as a high-end IC Tri-Temp test solution.

The Chroma 31000R-L can be seamlessly paired with Chroma models such as 3210, 3110, 3260, and 3200, providing a comprehensive SLT (System Level Test) Tri-Temp test solution suitable for both lab and fab environments. Chroma's Tri-Temp test solution caters to a diverse array of advanced and high-end IC applications, including Automotive, AI & Data Center, GPU, APU, HPC, Aerospace, and Defense. Designed to ensure that ICs perform flawlessly in harsh environments, this is the optimal choice for product reliability testing.

Insulation Quality Guardian for Power Semiconductor Devices

Power semiconductor devices (e.g., IGBTs, SiC-MOSFETs) are used in various fields which tend to employ high power/large current for power conversion/control circuits, and isolators (e.g., optocouplers, digital isolators) are used in environments where the voltage difference between two sides (i.e. primary side and secondary side) needs to be isolated. Because higher voltage differences or potential differences appear across these components, it is very important to ensure that these components can maintain a good voltage insulation under normal operating conditions and have no continuous partial discharge (PD) which can lead to insulation degradation. Chroma 19501 Series Partial Discharge Tester complies with the PD measurement requirement of IEC 60270-1, and the test methods specified in the regulation have been designed into the instrument. It can provide AC Hipot test (max. 10kVac) and partial discharge measurement (max. 6000pC), which can effectively ensure the quality and reliability of long-term operation for power semiconductor devices and isolators.

Advanced Packaging Test Solutions

For advanced packaging processes, Chroma has developed contactless optical inspection equipment using proprietary technology. Chroma 7961 in situ AOI assists customers in detecting defects during the manufacturing process, enabling real-time analysis and control of production quality. The Chroma 7980 2D/3D Wafer Metrology System, featuring our patented BLiS technology, provides nanoscale 2D/3D critical dimension (CD) measurements. With hardware and software optimized for specific applications, Chroma 7980 has already seen use in various 2D/3D CD metrology applications for advanced packaging processes such as TSV and RDL.

Nanoparticle monitoring system for semiconductor materials

As the quality demands for semiconductor materials continue to escalate, material inspection and monitoring become all the more critical. The SuperSizer In-line Nanoparticle Monitoring System successfully identifies nanoparticles and impurities of liquid chemicals that affect the production yield, helping processing engineers to "see" ultrafine particles in technology nodes below 20 nanometers (nm). The measurement process is completely undisturbed by nanobubbles and accurately measures the size and quantity distribution of particles as small as 3 nm, enabling users to control risks and get a full grasp on yield.

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本文由翊翊所思转载自CHROMA官网，原文标题为:Chroma ATE Showcases Advanced Test Technology to Propel the AI Revolution at SEMICON Taiwan 2023，本站所有转载文章系出于传递更多信息之目的，且明确注明来源，不希望被转载的媒体或个人可与我们联系，我们将立即进行删除处理。

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R,2591690000,VSSC4 CL FG48VAC/DC0.5A,VSPC 2SL 5VDC R,VPU AC II 1 350/50,VSSC 6 RS 232,VSSC6 RS485 EX,1064430000,2619120000,8948610000,VPU IOT AC II 3+1 300/50,VSPC 2CL 12VDC R,VSPC 1CL 60VAC,2665740000,2674470000,VSSC4 SL 48VAC/DC 0.5A,1351880000,VPU ZPA S I 3 R 300/12,5,VPU AC I 2 R 300/12.5,2591080000,2807430000,VSPC 2SL 24VDC EX,1064330000,VSPC BASE 4SL FG EX,2591320000,1064090000,1161170000,1064270000,2591140000,VSSC6 RS485 DP,VSPC 2CL HF 24VDC,8924400000,VSSC RTD,1161180000,2827630000,VSPC 1CL EX,VPU ZPA I 3+1 A 300/7,5,VPU AC II 1+1 350/50,1351340000,8951480000,VSSC6 TR CL,8924230000,VSPC MOV,VSSC6 CLFG48VAC/DC0.5A,2639320000,VPU AC II US 3 R 120/50,2674370000,VSPC 1CL 5 V DC 0,5 A,8951710000,VSSC4 SL FG 12VDC 0.5A,VSPC 1CL 12 V DC 0,5 A,VSSC6 TR SL LD,VPU AC II F 3+1 300/40,VPU AC II US 3 R 240/50 Y,8924330000,2063080000,8951540000,VSPC 1CL 5VDC R,2730790000,VARITECTOR SSC 4AN,VPU AC II US 4 R 277/50,VSPC 2CL 24 V DC 0,5 A,VSPC GDT,VPU ZPA S I 3 RA 300/7,5,VPU AC I 1 R 480/10,MCZ OVP CL 24VUC 1,25A,VPU AC II US 1 277/50,PLUG VPU,VPU AC II 1 R 150/50,VSPC 2CL HF 12VDC,VSPC BASE 1CL PW FG,VPU AC S-LINE,VPU ZPA S I 3+1 300/12,5,1064280000,1139710000,VSPC 3/4WIRE 5VDC EX,1063980000,1066490000,2736320000,2775000000,VPU AC I 3+1 R 275/25 LCF MB,VPU AC II 1 R 300/50,VPU II PV 3 1500,VPU AC I 3+1 R 440/25 LCF,VSPC MOV 2CH 230V R,1351870000,2730510000,VPU AC I 1 300/12.5 LCF,8924220000,VSPC BASE 2SL,VDATA CAT6,2755980000,2591050000,8951810000,VPU AC I 1 N-PE 305/100 S,VSPC UKO,1064400000,VPU I 3+1 280V/25KA,2591130000,VSPC 1CL 24VAC R,VPU ZPA I 3 300/7,5,WAVEFILTER 6A,VPU AC I 4 440/25 LCF,1161190000,2730860000,VPU I 3+1 R 280V/25KA,VPU III SO LD,8951720000,2639330000,VPU I 1 R 400V/25KA,1064080000,VSPC RS485,VPU PV I+II 3 R 1000,VARITECTOR SSC 6AN,2530610000,VSPC 1CL PW EX,2591410000,8951530000,1064980000,1309470000,VSSC6TRCLFG60VAC/DC0.5A,VSSC6 TRCL60VAC/DC0.5A,VPU AC II US 3 277/50,VSSC4 MOV 24VAC/DC,2638070000,2619100000,8948600000,2674440000,VPU AC I 2 300/12.5,VPU ZPA S I 3 R 300/7,5,VPUM2I2SXFXV1O1TXPX10,VPU AC I 3+1 300/12.5,VPU III R 230V/6KV AC,VSSC6 MOV 24VAC/DC,VPU AC I 1 R 275/25 LCF MB,VPU AC II US 1 60/50,8449030000,1063990000,2593120000,VPU AC I 4 R 275/25 LCF MB,VPU AC II 2 R 480/50,VPUM2I2SXFXV1O0TXPX10,VPU AC II 2 R 75/50,VSSC6TRSLLD48VAC/DC0.5A,VSPC 4SL 60VAC,2807410000,2736310000,VPU PV I+II 3 1500,1064350000,VPU AC I 1+1 R 300/12.5 LCF,VSPC 2CL HF 12VDC R,VPU AC I 1+1 R 440/25 LCF,VPU AC II 3+1 350/50,V DATA CAT 6,1064290000,1473440000,VPU AC II US 3+1 R 240/50 Y,8924210000,1351370000,VSPC 2CL 24VAC R,VPUM2I2SXFXV2O1TXPX10,VPU ZPA S I 3+1 RA 300/7,5,QB 17,8/2,VSSC6 TR SLFG LD,VSPC BASE 4SL,VPUM2I2SXFXV2O1TXPX15,VSSC4 CL FG 24V AC/DC 0,5,VPU ZPA I SERIES,VSPC GDT 2CH 150VAC/230VDC,2730500000,8951730000,1064070000,2674450000,VPU I 3+1 R 400V/25KA,2591060000,2591120000,VSSC6 TR GDT,8951800000,VPU AC II US 2 R 277/50,2755990000,8951460000,1064990000,2674510000,VPU AC II 2 R 750/35,8924420000,VSSC6 TRLDMOV 24VAC/DC,1351700000,VPU AC II US 1 R 120/50,VPU AC II US 4 240/50,VSPC 2CL,VPU AC II 2 75/50,VPU III R 48 V DC,2674390000,2639340000,VPU AC II 4 R 300/50,WAVEFILTER 3A,VSPC 2SL 24VDC R,VPCB PV I+II M 1000,2591400000,MCZ OVP HF 5V 0,3A,VPU ZPA S I 3 300/12,5,2807400000,VSSC6 CL FG 12VDC 0.5A,2591350000,VSSC6 TR CLFG EX,2591510000,VSPC 1CL 5 V DC 0,5 A R,2591270000,VSSC6 GDT 24VAC/DC 10KA,1064700000,VSSC4 RC 240VAC/DC,VPU AC II US 4 277/50,VPU AC II 1 75/50,8449040000,VPU II 2 R PV 600V DC,8924200000,1428780000,VSSC6 CLFG24VAC/DC0.5A,VSSC6 TR CL 12VDC 0.5A,VSSC6SL LD24VAC/DC0.5A,VSPC BASE 2CL FG EX,VPU AC II 4 R 480/50,2530580000,VPU AC II US 3 R 240/50,1438020000,VSPC 2SL 12VDC,VPU PV I+II 3 R 1500,VSPC BASE 1CL PW FG EX,2830900000,VPU AC II US 1 R 600/35,VPU IOT AC SERIES,VPU AC II 1 R 750/35,8924350000,VPU AC I 12,5 KA,VPU AC I 3 R 480/10,VPU AC II 2 R 300/50,VSPC 1CL 24VDC R,VPU AC I 1 480/10,VSPC 2SL 48VAC,2636910000,1064150000,2830890000,VPU ZPA I 3+1 R 300/7,5,2665770000,1064310000,2062940000,2636920000,VSPC 4SL,V

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TE Connectivity（泰科TE） SENSOR SOLUTIONS POSITION SENSORS PRODUCT GUIDE

描述- TE Connectivity提供广泛的线性、角度位置、倾斜和液位传感器，适用于汽车、建筑、能源、医疗、HVACR、计量、过程控制和工厂自动化等多个行业。产品包括LVDT、LVIT、RVDT、RVIT等感应线性位置传感器，以及基于AMR和霍尔效应技术的绝对和增量线性、角度编码器。产品具有高可靠性、长寿命和低维护成本等特点，适用于各种恶劣环境。

05/2015 - TE CONNECTIVITY - 应用及方案代理服务技术支持批量订货

3650-S2型SOC/模拟测试系统

描述- 该资料介绍了Chroma 3650-S2半导体测试系统。它具备高并行测试能力，适用于各种数字、模拟和混合信号应用。系统具有高达768个数字I/O引脚和模拟引脚，支持多种电压和电流供应选项，并配备强大的软件工具CRISP，提供高效的测试解决方案。

型号- MODEL 3650-S2,3650-S2,3650 SERIES-2

202311 - CHROMA - 数据手册代理服务技术支持批量订货查看更多版本

射頻晶片S參數加強版測試儀 MODEL 35806S

描述- 该资料介绍了Chroma 35806S射频测试仪的特点和应用。它专为研发和质量控制（RD/QC）用户设计，具备简单易用的界面、内置信号数据库和RF ATE自动测试功能。该设备支持6GHz频率范围，具有双向和发送（Tx）广播功能，并包含向量网络分析仪（VNA）功能和噪声指数测量。适用于物联网连接应用、功率放大器/前端模块、广播接收机和卫星定位接收机等领域。

型号- 35806S,MODEL 35806S

202308 - CHROMA - 数据手册代理服务技术支持批量订货

3680型先进SOC/模拟测试系统

描述- 该资料介绍了Chroma公司的SoC/模拟测试系统Model 3680。该系统具备高并行测试能力，支持高达2048个引脚的设备测试，提供灵活的配置和广泛的覆盖范围，适用于不同类型的数字、模拟和混合信号应用。

型号- 3680,MODEL 3680

202110 - CHROMA - 数据手册代理服务技术支持批量订货查看更多版本

射頻晶片測試儀 MODEL 35806

描述- 本资料介绍了Chroma射频芯片测试仪35806的特点和应用。该仪器专为研发和质量控制（RD/QC）用户设计，具备简单易用的人机界面、完整的测试案例和数据，以及内置信号数据库以满足生产测试需求。它支持RF ATE自动测试，并可与现有的Chroma 3380/3650/3680 ATE测试方案集成。35806采用软件定义无线电(SDR)架构，包含VSG/VSA功能，频率范围为6GHz，具有双向和发送(Tx)广播功能。此外，还提供了用于生产自动化程序编写的API。

型号- MODEL 35806,35806

202308 - CHROMA - 数据手册代理服务技术支持批量订货