Chroma ATE Exhibits Test Solutions to Drive the AI Revolution at SEMICON China 2023

CHROMA ATE Inc., a leading provider of automated test equipment, is participating in SEMICON China 2023. The company will exhibit a series of innovative semiconductor test solutions with a focus on artificial intelligence (AI), high-performance computing (HPC), automotive, and AIoT applications.

Ultra-Low Temperature Test Solution

Chroma introduces the brand-new A310002 ultra-low temperature test system, a Tri-temp test system with a stable temperature control range of -70 to +150℃. This system is suitable for various extreme temperature tests and has a thermal design power (TPD) of up to 1,000 watts. It can be combined with the Chroma 3200 Versatile SLT Test Platform to form a multi-station SLT test ecosystem for production line use. In addition, the system can be easily paired with Chroma's software toolset CVOT (Chroma Virtual Operation Tools) to efficiently manage product information and improve yield. Chroma's ultra-low temperature test solution can meet the needs of industries such as automotive semiconductor ICs, artificial intelligence, and data centers, graphics processors (GPU), accelerated processing units (APU), high-performance computing (HPC), aerospace, and defense testing applications. Designed to ensure that chips can operate without issues in harsh environments, this is a great solution for product reliability testing.

Power IC Test Solution

The Chroma 3650-S2 SoC/Analog Testing System is a high-performance Power IC test platform that meets the needs of today's high-voltage, high-current, and complex digital control Power ICs. It provides up to 768 digital I/O and analog pins with a power supply capacity of up to 3000V or 320A. Chroma 3650-S2, developed based on more than 10 years of experience in digital solutions, comes equipped with capabilities such as up to 768 pins, 200Mbps data rate, and 300ps edge placement accuracy (EPA). It's an ideal choice for testing lithium battery management system (BMS) ICs, power management ICs (PMIC), and GaN- and SiC-related Power ICs.

Advanced SoC Test Solution

The Chroma 3680 Advanced SoC Test System effectively meets the testing needs of cutting-edge chips used in AI and automotive technologies. This solution is specifically designed for the increasingly popular system-on-chip (SoC) and system-in-package (SiP) applications. The system provides up to 2048 I/O pins with data rates up to 1Gbps, supports up to 16G integrated SCAN vector memory, and offers a variety of test modules for users to choose from. It has the capability to simultaneously perform digital logic, parametric test unit, power, memory, mixed-signal, and RF wireless communication tests.

RF Chip Test Solution

The Chroma 3680/3380/3300 Automated Test Systems can be seamlessly combined with the ADIVIC MP5806S（rf ate tester） to form a complete radio frequency (RF) chip test solution. Equipped with S-Parameter and Noise Figure functions, this solution can thoroughly test FEM/PA/Switch/LNA components and supports Bluetooth, Wi-Fi, NB-IoT, GPS/BeiDou (IoT) communication standards and Tuner applications, enabling more comprehensive RF chip testing.

SEMICON China 2023 will be held from June 29 to July 1 at the Shanghai New International Expo Center. Make sure to drop by our Booth E3157 in Hall E3 to experience the latest trends shaping the future of test and measurement technology. We look forward to connecting with you!