【产品】适用于终端测试或系统功能测试的3110双用单站测试分类机,支持各种不同类型封装的晶片
CHROMA的3110 是一台双用单站的 Pick & Place 测试分类机,支持各种不同类型封装的晶片,如BGA, μBGA, QFP系列, QFN, Flip-Chip, TSOP等。此分类机运用 Pick & Place 技术,将待测晶片由进料舱移至测试区,再依测试结果进行分类。3110 不但适用于系统功能检测,也同时具备终端电性测试的能力。可综合各元件的整体效能并执行测试系统上的所有测试程式,旨在提供一个全能的解决方案。
支持的晶片尺寸从 3×3mm 到 55×55mm,配备有自动进出料分类舱及手动分类盘,可最优化工程测试的实验数量。简易操作的操控画面,及适配性高的testers连接介面,大幅提升机台的使用率及共用性。除此之外,它能针对不同的测试环境条件,提供数个温控系统的选择,如三温控制系统、高功率冷却系统等,测试的环境温度可设置于常温、高温或低温。
3110双用单站测试分类机的主要特色:
· 双用单站测试分类机
· 适用于终端测试或系统功能测试
· 自动进料出料舱的配置及依测试结果自动分类的功能
· 测头内建气室,可吸收及减缓下压触力的冲击
· 智能型的载盘IC残留侦测
· 可选配的三温控制系统 (Standard: -40℃ ~ 135℃, Option: -55℃ ~ 150℃)
· 可选配的高功率冷却系统
· 理想的产品工程或研发实验设备机,可自动搜集与分析测试、实验结果的数据
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本文由宝丁转载自Chroma,原文标题为:双用单站测试分类机 Model 3110,本站所有转载文章系出于传递更多信息之目的,且明确注明来源,不希望被转载的媒体或个人可与我们联系,我们将立即进行删除处理。
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